List of available equipment

Diffractometer/Reflectometer

DIFFRACTOMETER/REFLECTOMETER
Bruker D8 ADVANCE

 

 

Glancing Incidence X-ray diffraction technique is employed for thin films characterisation, as it is surface sensitive. Specular reflectivity (XRR) can characterize films in the range of 1nm to about 1000 nm in thickness depending on the material. It provides accurate measurement of thin film thickness, density and the interface width between layers. Non-specular scattering measurements yield information about layer interface, and it is possible to the difference between surface roughness and layer interdiffusion. Commercially available simulation packages are used for the modelling and understanding of specular and non-specular scattering data.

 

   

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Welcome to the new PhD Students Nicolò, Veronica and Andrea!